Microscopic examination type
Tests using four types of material phase microscopy, depending on the nature of the workpiece as well as the investigation target, these types of microscopic examination as described below.
Optical microscopy
In optical microscopy, use different filter to improve contrast, enhance their specific characteristics and based on the material properties.This usually can use within the scope of 2.5 times to 1000 times magnification.In material reading, the reflected light is the most commonly used type of optical microscopy.Also can use the launch of the optical microscopy, but it is mainly used for mineral sample.
Stereoscopic optical microscopy
Stereoscopic microscopy is the use of reflected light from the sample surface, low magnification observation was carried out on the sample of optical microscopy.
Scanning electron microscopy
Scanning electron microscopy (SEM) is a class of electronic microscopy, can use focused electron beam scanning the sample surface, resulting in a sample of the image.The electrons interact with the atoms in a sample, can be converted into on the specimen surface morphology and composition of various signals.
Transmission electron microscopy
Using transmission electron microscopy (TEM), electron beam cast thin specimens and to interact with it through the sample.The signal can be converted into various types of information, including information about each crystal type and orientation.
